Copy of: Single-event characterization of 7-nm technology node
收藏B2FIND2026-04-25 收录
下载链接：
https://b2find.eudat.eu/dataset/7f8f3c10-fcf8-56a2-95b0-6fa8945b9f87
下载链接
链接失效反馈官方服务：
资源简介：
Semiconductor industry is currently offering 7 nm technology node with FinFET fabrication processes. Soft error causing mechanisms and error rates for FinFET technologies are...
