The AFM micrographs of vanadium oxides thin films deposited on quartz glass - the influence of the thickness of the thin film on its morphology
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The DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a quartz glass substrate and were annealing at 300°C under synthetic air.
A Nanosurf Easyscan 2 AFM atomic force microscopy was used to examine the morphology of thin films.
提供机构：
Marta Prześniak-Welenc
