test of the structural resolution for perovskite thin films
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https://b2find.eudat.eu/dataset/a18e65a1-0ba2-5e3c-970c-a624a42db9df
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资源简介：
the aim of the test is to use low intensity (non-destructive) mode to ptobe crystal structure and texture of ferroelectric thin films with perovskite -type structure
