"Experimental data of neutron induced single event effect"

"Optocouplers are critical components for electrical isolation in aerospace and nuclear electronic systems, where their susceptibility to neutron induced single event transients (SETs) directly impacts system reliability. Conventional radiation assessments often rely on static or powered-off conditions, failing to capture device behavior under realistic signal transmission scenarios. To address this limitation, we conducted broad-spectrum neutron irradiation experiments on representative optocoupler devices using the Atmospheric Neutron Irradiation Spectrometer (ANIS) at the China Spallation Neutron Source (CSNS). By employing a high-speed waveform acquisition system integrated with time-of-flight (TOF) techniques, we quantitatively compared SET cross-sections, pulse waveform characteristics, and differential cross-section energy spectra of light-emitting diodes (LEDs) under both off-state and on-state bias conditions. Experimental results reveal that the radiation sensitivity of optocouplers is significantly modulated by their internal \u201celectrical-optical-electrical\u201d coupling topology: compared to the off-state, the LED on-state not only increases the SET cross-section by up to a factor of six but also causes anomalous pulse widening from the nanosecond scale (<10 ns) to hundreds of nanoseconds (~400 ns). Differential cross-section analysis indicates that this amplification effect saturates for neutron energies above 20 MeV and follows a Weibull distribution. Mechanistic analysis attributes the enhanced transient amplitude and prolonged duration to the nonlinear superposition of steady-state photocurrent and radiation-induced charge. These findings suggest that reliance solely on static test data may substantially underestimate the soft-error risk of optocouplers under dynamic operating conditions. The dynamic response characteristics and quantitative models presented herein provide essential experimental evidence and physical insights for optocoupler selection, radiation hardening, and the refinement of anti-radiation testing standards in high-reliability systems."