XPS, HAXPES, XRD and SEM datasets of functionalized graphene nanoplateletes

The datasets from (Hard Energy) X-ray photoelectron spectroscopy, X-ray diffraction and Scanning Electron Microsopy are related to the publication G. Chemello, X. Knigge, D. Ciornii, B.P. Reed, A.J. Pollard, C.A. Clifford, T. Howe, N. Vyas, V.-D. Hodoroaba, J. Radnik "Influence of the morphology on the functionalization of graphene nanoplatelets analyzed by comparative photoelectron spectroscopy with soft and hard X-rays" Advanced Materials Interfaces (2023), DOI: 10.1002/admi.202300116. Details of the materials and the experimental procedures are described in this publications. The filenames contain the material (g5 or g6), functionalization (Fluorine -f, Oxygen _o and raw material _raw), methods (XPS/HAXPES survey or high resolution, XRD, SEM). For the fitted spectra the peak is given: c1s, o1s, f1s. The data are given as tif-files for SEM (*tif). as asc ii files for XRD (*.xy) and the fitted XPS/HAXPES-spectra (*.dat) and as vamas data files for the XPS/HAXPES raw-data (*.npl).本数据集涵盖X射线光电子能谱（X-ray photoelectron spectroscopy, XPS）、硬X射线光电子能谱（Hard Energy X-ray photoelectron spectroscopy, HAXPES）、X射线衍射（X-ray diffraction, XRD）以及扫描电子显微镜（Scanning Electron Microscopy, SEM）相关测试数据，关联发表论文：G. Chemello、X. Knigge、D. Ciornii、B.P. Reed、A.J. Pollard、C.A. Clifford、T. Howe、N. Vyas、V.-D. Hodoroaba、J. Radnik所著《Influence of the morphology on the functionalization of graphene nanoplatelets analyzed by comparative photoelectron spectroscopy with soft and hard X-rays》，发表于*Advanced Materials Interfaces*（2023年），DOI: 10.1002/admi.202300116。相关材料与实验流程的细节已在该论文中详述。 各文件的命名包含以下标识信息：材料类型（g5或g6）、功能化修饰类型（氟修饰-f、氧修饰-o 与原始样品_raw）、测试方法（XPS/HAXPES全谱或高分辨谱、XRD、SEM）。针对拟合后的能谱，文件名还标注了对应的特征峰：c1s、o1s、f1s。 数据存储格式如下：扫描电子显微镜测试数据以tif文件（*.tif）存储；X射线衍射数据以ASCII格式的.xy文件存储；XPS/HAXPES拟合能谱以.dat文件存储；XPS/HAXPES原始数据则以vamas格式的.npl文件存储。