Supplementary Information
收藏NIAID Data Ecosystem2026-05-02 收录
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https://figshare.com/articles/dataset/Supplementary_Information/27194913
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资源简介:
1. Atomic force microscopy and transmission electron microscopy measurement
2. Full width at half maximum of the Pt(111) XRD peaks and estimation of grain sizes
创建时间:
2024-10-17



