XPS C1s spectra of Graphite and Graphene oxide

XPS spectra were obtained in a Kratos Axis Ultra DLD irradiating the samples with an Al monochromatic Kα radiation of energy (1486.6 eV) at a power of 150 W. C1s high resolution spectras of all samples were performed with pass energy of 20 eV. ). In the Graphite spectra, we can see the main peak corresponding to the sp2 carbon, two other peaks related to the sp3 carbons and to the hydroxyl group, and a band corresponding to the shake-up satellite π-π*, typical of aromatic bonds. For GO samples, two convoluted peaks appeared in the principal spectra, centered at 284.76 and 286.78. The deconvolution of these peaks reveals one peak of sp2 carbon, one peak of sp3 carbon, four peaks of oxidized carbons groups (hydroxyl, epoxy, carbonyl, and carboxyl) and one peak of shake-up satellite (plasmon π-π*).本实验使用Kratos Axis Ultra DLD型X射线光电子能谱（X-ray Photoelectron Spectroscopy，XPS），以能量为1486.6 eV、功率为150 W的单色Al Kα辐射辐照样品，采集得到XPS谱图。所有样品的C1s高分辨谱均采用20 eV的通能进行采集。在石墨样品的谱图中，可观察到对应sp²杂化碳的主峰、另外两个分别与sp³杂化碳和羟基相关的特征峰，以及对应π-π*振激卫星峰的谱带，该特征为芳香键的典型标志。对于氧化石墨烯（Graphene Oxide，GO）样品，其主谱中出现两个重叠峰，峰位分别位于284.76和286.78处。对上述峰进行解卷积分析后，可解析出一个sp²杂化碳峰、一个sp³杂化碳峰、四个氧化碳官能团（羟基、环氧基、羰基与羧基）对应的特征峰，以及一个等离子体π-π*振激卫星峰。