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XRD file presenting phase purity of the SS316L wick material

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A file presents X-ray diffraction (XRD) analysis in the 10–90° range to verify the phase purity of the wick material. The measurements were performed on the exposed surface of the cylindrical sample. The XRD diffractogram of the SS316L sample was measured in an air atmosphere. This research was supported by National Science Centre grant OPUS no. UMO-2022/47/B/ST8/01490

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Paweł Szymański
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