X-ray diffraction (XRD) of silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
收藏DataCite Commons2023-10-19 更新2025-04-16 收录
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资源简介：
Data contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
Data consists:
Bi2O3 coated with silica shell - synthesized with method A
Bi2O3 coated with silica shell - synthesized with method B
Gd2O3 coated with silica shell - synthesized with method A
Gd2O3 coated with silica shell - synthesized with method B
提供机构：
Gdańsk University of Technology
创建时间：
2023-10-19
