X-ray diffraction (XRD) of silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
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Data contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å) Data consists: Bi2O3 coated with silica shell - synthesized with method A Bi2O3 coated with silica shell - synthesized with method B Gd2O3 coated with silica shell - synthesized with method A Gd2O3 coated with silica shell - synthesized with method B
创建时间：
2023-10-19
