Microstructural and stress data from HR-EBSD and STEM analyses of olivine deformed by low-temperature plasticity

This dataset is supplemental to the paper Wallis et al. (2020) and contains data derived from syn-chrotron X-ray diffraction, electron backscatter diffraction (EBSD), high-angular resolution electron backscatter diffraction (HR-EBSD), and scanning transmission electron microscopy (STEM). The da-taset consists primarily of measurements of the effect of annealing on stress heterogeneity meas-ured by X-ray diffraction; maps of lattice orientation measured by EBSD; maps of lattice rotations, densities of geometrically necessary dislocations (GNDs), and heterogeneity in residual stress measured by HR-EBSD; and images of dislocations obtained by STEM. Data are provided as 66 tab delimited text files organised and labelled by the figure in which they first appear within Wallis et al. (2020). Table 1 of the data description file presents an overview of the datasets and Table 2 provides a description of each data file. Data types are also indicated in the file names.