Measurement and simulation data for "Identification of aliasing effects in measurements of unknown MTFs"

The provided data set and simulation software enables the immediate replication of the results presented in "Identification of aliasing effects in measurements of unknown MTFs." The research data is structured with respect to the figures presented in the contribution. Each subfolder contains all necessary measurement or simulation data to receive the figure from the contribution by running a MATLAB file. Therefore, it is possible to compare the results with full context to those presented in the contribution. The simulations demonstrate the influence of aliasing on MTF measurements employing the slanted slit algorithm. The measurement data saved as *.mat files contains the tilted slit images as recorded by the camera detectors. Each set of measurement data contains the following variables: -binning -> The pixel binning factor applied in the camera -camera -> The name of teh camera device -exptime -> The employed exposure time -magnification -> The applied microscope magnification -*image -> The recorded LSF images The specimen under test is a calibration objective manufactured by Zeiss with infinite to finite imaging, a focus distance of f_s = 50mm and an f-number a_s = 4. The following abbreviations are employed in the labeling of the subfolders: MTF -> Modulation Transfer Function Pco -> Refers to the camera model Pco Panda camera employed in the experiment Bas -> Refers to the camera model Basler Ace 2 camera employed in the experiment 20x,10x,6.3x -> Refers to the magnification of the microscope objectives employed in the experiment The experimental data is evaluated employing the slanted slit algorithm and shows the influence of aliasing and uncorrected influences from detector and objective characteristics on the MTF measurement. The oversampling achievable by the slanted slit method is demonstrated to resolve the aliasing issues and provides a tool to identify and correct aliasing errors in unknown MTF measurements.