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High temperature XRD diffraction patterns collected during the reoxidation process of SFM-based compounds

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Most Wiedzy Open Research Data Catalog2026-04-17 收录
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https://mostwiedzy.pl/en/open-research-data/high-temperature-xrd-diffraction-patterns-collected-during-the-reoxidation-process-of-sfm-based-compounds,112031929129365-0
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This dataset contains three file folders for SFM, LSFM (La-doped) and SFMNb (Nb-doped) respectively. Samples were reduced prior to the XRD measurements. The measurements were performed on Philipps X’Pert Pro diffractometer using a high-temperature Anthon Paar HT-1200 oven adapter. Scans were performed each 50 deg. in air. The data in dataset were already exported to the *.asc from *.xrdml.
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