Atomic force microscope measurements of selected sub-pattern ridge-top surface roughness on patterned Ti and Si substrates, including average roughness (Ra), root mean square roughness (Rsq), and maximum roughness (Rmax).
收藏Figshare2015-12-02 更新2026-04-29 收录
下载链接：
https://figshare.com/articles/dataset/_Atomic_force_microscope_measurements_of_selected_sub_pattern_ridge_top_surface_roughness_on_patterned_Ti_and_Si_substrates_including_average_roughness_R_a_root_mean_square_roughness_R_sq_and_maximum_roughness_R_max_/1223544
下载链接
链接失效反馈官方服务：
资源简介：
Data = mean ± standard deviation (n = 5).Atomic force microscope measurements of selected sub-pattern ridge-top surface roughness on patterned Ti and Si substrates, including average roughness (Ra), root mean square roughness (Rsq), and maximum roughness (Rmax).
创建时间：
2015-12-02
