Stim circuits and collected data for "Error-corrected Hadamard gate simulated at the circuit level" manuscript
收藏NIAID Data Ecosystem2026-05-01 收录
数据链接:
官方服务:
资源简介:
The stim circuits which we sampled to obtain logical failure probabilities, and the collected data organised in an excel file.
创建时间:
2023-12-15



