Three-dimensional in-situ imaging of single-grain growth in polycrystalline In2O3:Zr films

Original data

Here, we image a single-grain growth during the amorphous-to-polycrystalline transition in technologically relevant transparent conductive oxide (TCO) film of In2O3:Zr with in-situ Bragg coherent X-ray diffraction imaging.

Data was obtained at 34ID-C end-station at Advanced Photon Source, Argonne National Laboratory (USA).

Repository contains all raw datasets of the BCDI measurements, .spec files with corresponding meta-data, and .xlsx table with information on scan numbers related to annealing steps of the sample.