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X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Library manuscript Ms. CBL Is 1431

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University of Hamburg2022-02-11 更新2026-04-17 收录
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资源简介:

XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis of inks and pigments from Ms. CBL Is 1431. CBL_Is1431_Report.docx - detailed report Is1431_XRF.zip - complete XRF Dataset Is1431_reflectography.zip - complete reflectography Dataset

提供机构:
Bonnerot, Olivier
创建时间:
2022-02-11
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