Measurements of distorsion in CrPS4 via XNLD
收藏ESRF Portal2028-01-01 更新2026-04-23 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-2241125209
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资源简介：
In this inhouse XNLD at room temperature and low temperature (20 K) on CrPS4 will be measured in order to confirm electronic distorsion, calculated from simulations.
提供机构：
ESRF, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France; Universita degli Studi di Milano Bicocca, Dipartimento di Scienza dei Materiali, Via Cozzi 53, 20125 , Milano, ITALY
创建时间：
2028-01-01
