Measurements of distorsion in CrPS4 via XNLD

Name: Measurements of distorsion in CrPS4 via XNLD
Creator: ESRF, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France; Universita degli Studi di Milano Bicocca, Dipartimento di Scienza dei Materiali, Via Cozzi 53, 20125 , Milano, ITALY
Published: 2028-01-01T00:00:00+08:00

ESRF Portal2028-01-01 更新2026-04-23 收录

材料电化学表征

量子材料畸变测量

数据链接：

https://doi.esrf.fr/10.15151/ESRF-ES-2241125209 数据链接链接失效反馈

官方服务：

资源简介：

In this inhouse XNLD at room temperature and low temperature (20 K) on CrPS4 will be measured in order to confirm electronic distorsion, calculated from simulations.

提供机构：

ESRF, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France; Universita degli Studi di Milano Bicocca, Dipartimento di Scienza dei Materiali, Via Cozzi 53, 20125 , Milano, ITALY

创建时间：

2028-01-01