measurements
收藏ESRF Portal2027-01-01 更新2026-04-23 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-1960111965
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资源简介：
in the framework of the MIAM project we will test some automatic mesh measurements to fix the setup and the time scale for such experiments. Sample are Si 4 inches wafers with sputtered layer on top. The deposit of the layer had been done at the N'eel institute.
提供机构：
CNRS - Institut Neel, SERAS, 25 rue des Martyrs, Bp 166, 38042 Grenoble Cedex 9, France; CNRS - Institut Neel, Nano Laboratoire, 25 avenue des Martyrs, 38042 Grenoble, France; CNRS , Laboratoire Louis Neel, 25 rue des Martyrs, Bp 166x, 38042 Grenoble Cedex 09, France; Institut Neel, Departement QUEST, 25, rue des martyrs, 38042 Grenoble 9, France; Institut Neel, Micro & Nanomagnetism/Nano Department, 25 rue des martyres, BP 166, 38042 Grenoble, France
创建时间：
2027-01-01
