Data supporting Holey Substrate-Directed Strain Pattering in Bilayer MoS2
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https://hdl.handle.net/11299/225240
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资源简介：
This data set contains transmission electron microscopy (TEM), atomic force microscopy (AFM), and atomistic simulation data supporting "Holey Substrate-Directed Strain Pattering in Bilayer MoS2" manuscript cited in referenced by.
提供机构：
Data Repository for the University of Minnesota (DRUM)
创建时间：
2021-11-29
