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Data supporting Holey Substrate-Directed Strain Pattering in Bilayer MoS2

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DataCite Commons2022-03-08 更新2025-04-09 收录
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This data set contains transmission electron microscopy (TEM), atomic force microscopy (AFM), and atomistic simulation data supporting "Holey Substrate-Directed Strain Pattering in Bilayer MoS2" manuscript cited in referenced by.

创建时间:
2021-11-29
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