Data from: Three dimensional classification of dislocations from single projections

About This repository contains the experimental data for the article: T. Niermann, L. Niermann, M. LehmannThree dimensional classification of dislocations from single projectionsNature Communications 15 (2023) 1356DOI: https://doi.org/10.1038/s41467-024-45642-z If you use this data, please include a citation to the above article. For further questions, please contact Tore Niermann (tore.niermann tu-berlin.de) Contents raw_data_dislocation_A.hdf5 The file contains a dataset "data" representing the 4D-STEM measurementsof dislocation A in (0002) systematic row conditions. Dimension #0: Scan y-axis (scale: 0.78125 nm/px)Dimension #1: Scan x-axis (scale: 0.78125 nm/px)Dimension #2: Diffraction y-axis (scale: 0.074677 nm^(-1)/px)Dimension #3: Diffraction x-axis (scale: 0.074677 nm^(-1)/px) Please note, the diffraction coordinate system is mirrored and rotatedwith respect to the scan coordinate system. Further experimental details: Microscope: JEOL ARM300F2 Acceleration_voltage (kV): 300.0 Spot Size: 4C Alpha Selector: ALPHA1 Indicated Magnification: 1000000.0 Indicated Camera Length (cm): 30.0 Dwell time (ms): 1.3 raw_data_dislocation_B.hdf5 The file contains a dataset "data" representing the 4D-STEM measurementsof dislocation A in (2 -1 -1 0) systematic row conditions. Dimension #0: Scan y-axis (scale: 0.78125 nm/px)Dimension #1: Scan x-axis (scale: 0.78125 nm/px)Dimension #2: Diffraction y-axis (scale: 0.074677 nm^(-1)/px)Dimension #3: Diffraction x-axis (scale: 0.074677 nm^(-1)/px) Please note, the diffraction coordinate system is mirrored and rotatedwith respect to the scan coordinate system. Further experimental details: Microscope: JEOL ARM300F2 Acceleration_voltage (kV): 300.0 Spot Size: 4C Alpha Selector: ALPHA1 Indicated Magnification: 1000000.0 Indicated Camera Length (cm): 30.0 Dwell time (ms): 1.3 Detector: Quantum Detector MerlinEM raw_data_aluminum.hdf5 The file contains a dataset "data" representing the 4D-STEM measurementsof the deformed aluminum measurements of Supplementary Note 1in (200) systematic row conditions. Dimension #0: Scan y-axis (scale: 0.78125 nm/px)Dimension #1: Scan x-axis (scale: 0.78125 nm/px)Dimension #2: Diffraction y-axis (scale: 0.074677 nm^(-1)/px)Dimension #3: Diffraction x-axis (scale: 0.074677 nm^(-1)/px) Please note, the diffraction coordinate system is mirrored and rotatedwith respect to the scan coordinate system. Further experimental details: Microscope: JEOL ARM300F2 Acceleration_voltage (kV): 300.0 Spot Size: 7C Alpha Selector: ALPHA1 Indicated Magnification: 1000000.0 Indicated Camera Length (cm): 30.0 Dwell time (ms): 50.0 Detector: Quantum Detector MerlinEM figS3_hologram.hdf5 - Supplementary figure 3 The amplitude and phase of the reconstructed hologram are provided within the datasets "amplitude" and "phase". Dimension #0: y-axis (scale: 2.998 nm/px)Dimension #1: x-axis (scale: 2.998 nm/px) figS5_overview.tif - Supplementary figure 5 Large area overview over GaN specimen. Original data file. Dimension #0: y-axis (scale: 0.78125 nm/px)Dimension #1: x-axis (scale: 0.78125 nm/px)