A67 raw data
收藏DataCite Commons2025-04-29 更新2025-05-10 收录
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资源简介：
Atomic Force Microscopy (AFM) topographic images of sample A67 (raw data). Images were acquired in dynamic mode. We used Nanosensors PPP-FM silicon probes with a spring constant of 3 N/m, resonance frequency of 75 kHz and a tip radius of about 10 nm. Images were acquired with a free oscillation of about 30 nm and an amplitude reduction set point of 25% of the free amplitude. All samples were simply cleaned with a gentle stream of N2 gas.
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contact.engineering
创建时间：
2025-04-29
