Unified Simulation Platform for Interference Microscopy

Interferometric scattering microscopy is a powerful technique
that
enables various applications, such as mass photometry and particle
tracking. Here, we present a numerical toolbox to simulate images
obtained in interferometric scattering, coherent bright-field, and
dark-field microscopies. The scattered fields are calculated using
a boundary element method, facilitating the simulation of arbitrary
sample geometries and substrate layer structures. A fully vectorial
model is used for simulating the imaging setup. We demonstrate excellent
agreement between our simulations and experiments for different shapes
of scatterers and excitation angles. Notably, for angles near the
Brewster angle, we observe a contrast enhancement which may be beneficial
for nanosensing applications. The software is available as a matlab toolbox.