WVM: A computer program for the determination of lattice parameters and strains in thin films

Abstract X-ray diffraction provides a method for the determination of the strain and stress tensor in a polycrystalline sample. The knowledge of the unstrained lattice parameters is a prerequisite to calculate strains from measured reflection shifts. For thin films a model exists to find the unstrained lattice parameters and the strain or stress tensor together from the measured reflection positions. Title of program: WVM Catalogue Id: ADDM_v1_0 Nature of problem Calculate the strain tensor epsilon 2<->and the strain-free lattice parameters of a thin polycrystalline film from measured X-ray reflection positions. Versions of this program held in the CPC repository in Mendeley Data ADDM_v1_0; WVM; 10.1016/0010-4655(96)00055-0 This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2019)摘要 X射线衍射（X-ray diffraction）是一种用于测定多晶样品内应变与应力张量（strain and stress tensor）的方法。若要通过实测的反射偏移量计算应变，需预先知晓无应变晶格参数（unstrained lattice parameters）。针对薄膜（thin films）体系，已有模型可通过实测的反射位置，同步求解无应变晶格参数与应变或应力张量。 程序名称：WVM 目录编号：ADDM_v1_0 问题概述 基于实测的X射线反射位置，计算多晶薄膜的ε₂应变张量与无应变晶格参数。 曼德莱数据（Mendeley Data）中CPC库收录的本程序版本： ADDM_v1_0; WVM; 10.1016/0010-4655(96)00055-0 本程序源自贝尔法斯特女王大学维护的CPC程序库（1969-2019）