Crystallographic data and refinement statistics.

aRsym = where Ii(h) and I(h) are the ith and mean measurement of reflection h.bRwork = , where Fo and Fc are the observed and calculated structure factor amplitudes of reflection h.cRfree = as for Rwork, but approximately 8% of the total reflections chosen at random and omitted from refinement.dIndividual B-factor refinement were carried out.*Reflections greater than I>σI where used in the refinement.#Values in the parentheses are corresponding to the highest resolution shell.¶Indicates the moderate quality of data.