SEM micrographs of morphology evolution of VO2 and V2O3 thin films obtained at 700°C|纳米材料数据集|扫描电子显微镜数据集
收藏Mendeley Data2024-01-31 更新2024-06-28 收录
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The DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (3-9 AsP layers) were deposited on a silicon substrate and were annealing at 700°C under an argon atmosphere. The surface morphologies of the samples were studied by an FEI Company Quanta FEG 250 scanning electron microscope (SEM) (Waltham, MA, USA), mounting the analyzed sample on a carbon conductive tape.
创建时间：
2024-01-31