Supplementary Material
收藏DataCite Commons2025-07-01 更新2025-07-19 收录
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https://aip.figshare.com/articles/dataset/Supplementary_Material/29252702
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资源简介：
The Supplementary Material provides detailed descriptions of the Bartington MS2 Magnetic Susceptibility Meter measurements and related analyses. Additionally, it discusses the Small-Angle X-ray measurements conducted in the presence of eMF, as well as the molecular dynamics simulations, Monte Carlo simulations, and classical density functional theory calculations.
提供机构：
AIP Publishing
创建时间：
2025-06-06
