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Average a(EX)-values of elements and oxides and percentage differences calculated using the XCOM and FFAST attenuation coefficients; uncertainties, seen in italics, apply to the rightmost decimal place of the data Abstract Proton-induced x-ray emission (PIXE) was used to assess the accuracy of the National Institute of Standards and Technology XCOM and FFAST photo-ionization cross-section databases in the low energy region (1–2 keV) for light elements
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