Percentage of single point mutations that do not alter the fitness of the circuit.

Data obtained by subjecting the best circuits of generation 6,000 to 10,000 single point mutations. The “functional” data refer to the mutations affecting the genes of functional gates (i.e. the gates that actively contribute to the output of the circuit). In this and in the following Tables/Figs of this section we refer to the 30 replications of the evolutionary experiment carried out in the no-fault condition with Stochasticity = 0.05 and MutRate = 0.02.