Dataset for the paper ''Synergistic Effect of Gamma Irradiation and Nitrogen Doping on Graphene Oxide for EMI Shielding''

The data collected within the study ''Synergistic Effect of Gamma Irradiation and Nitrogen Doping on Graphene Oxide for EMI Shielding''. Dataset includes FTIR, XRD, UV-vis, VNA analysis (S-parameters), Raman spectra, The data were generated as follows: Sample morphology was examined using a Tescan® LYRA 3 FEG/XMH scanning electron microscope (SEM) at 10 kV in high vacuum, with samples mounted on carbon tape. Chemical composition was analyzed by SEM-EDS INCAx-act LN2-free analytical silicon drift detector of characteristic X-rays with PentaFET® Precision with a Tescan® Mira3 XMU. Raman spectra were recorded using a DXR Raman microscope (532 nm laser, 2 mW, 10 × 10 s acquisition). The FTIR spectra were collected using a Thermo Scientific Nicolet iS20 spectrometer. X-ray diffraction (XRD) analysis was carried out using a Philips PW 1050 powder diffractometer equipped with Ni-filtered Cu Kα radiation and configured in the Bragg-Brentano geometry. Shielding effectiveness was evaluated using a Keysight Technologies® VNA (Streamline 5008A) by measuring the amplitude of the transmission coefficient in the 8-12 GHz range.