Block scanning strain measurement in Transmission electron microscope

This data set and the processing script is part of the publication "Smart HAADF-STEM scanning strategy for local measurement of strain at the nanoscale". The data set contains the 64x64 and 32x32 pixel subimage scanning along with the Bessel diffraction data. It is a comparison of the new scanning strategy called the "Block scanning" with that of the Bessel diffraction technique. The experiments were performed with the FEI Titan microscope operating at 300 kV high tension.The python script allows the extraction of the strain from the block scanning technique. The Bessel diffraction processing software can be found in the link: https://bitbucket.org/lutosensis/tem-thesis/src/master/