GaN Schottky I-V dataset and reproducibility code for reliability-aware sparse-temperature measurement planning
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资源简介：
Audited current-voltage data and reproducibility materials for reliability-aware sparse-temperature characterization of an Au/Ni/n-GaN Schottky diode. Version 1.2.0 adds the fixed matched-subset registry, frozen analysis protocols, learned-model and edge-extrapolation runners, integrity-checked LOTO/sparse/KAN outputs, seed-level summaries, and manuscript tables needed to audit the MLP, approximate GPR, and KAN comparators. The original third-party graphene/p-Ge measurements and the separate SiC workbook are not redistributed.
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Zenodo创建时间：
2026-09-27
