Angle Dependent Spectral Reflectance Material Dataset based on 945 nm Time-of-Flight Camera Measurements
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资源简介：
The dataset contains angle dependent spectral reflectance measurements of materials in the infrared spectrum at a wavelength of 945 nm taken by a time-of-flight camera, mounted on an adjustable angle measurement device. Each data file is structured in columns with two parameters: reflectance (%) and incidence angle (°). For each single material measurement a description file is attached in a separate ZIP-file. <strong>Note: </strong>Please always use the latest version!
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Zenodo创建时间：
2022-12-21
