AFM images of interdigitated ITO electrodes with thin film of POM deposited

A Digital Instruments Multimode-8 with a NanoScope V controller and E scanners (Bruker) was used for acquiring AFM images. The AFM data were analysed with NanoScope Analysis 1.50 software (Bruker). The AFM was operated in tapping mode. An isolation table (Veeco Inc., Metrology Group) was used to minimise vibrational noise. Aluminium-coated silicon tips on silicon cantilevers (Tap300Al-G, BudgetSensors) were used for imaging. The nominal tip curvature radius was approximately