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Spatially-Localized X-Ray Scattering And X-Ray Microtomography Measurements On Moso Bamboo

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Zenodo2020-09-18 更新2026-05-25 收录
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<strong>Spatially-localized X-ray scattering and X-ray microtomography measurements on Moso bamboo</strong> This data set is originally used in: Ahvenainen, P., Dixon, P. G., Kallonen, A., Suhonen, H., Gibson, L. J., &amp; Svedström, K. (2017). Spatially-localized bench-top X-ray scattering reveals tissue-specific microfibril orientation in Moso bamboo. <em>Plant Methods</em>. <strong>13</strong>:5 DOI: 10.1186/s13007-016-0155-1 This data set includes measurements on Moso bamboo (<em>Phyllostachys edulis</em>) performed with two separate set-ups at the Department of Physics, University of Helsinki as described in the above open-access publication. The X-ray microtomography (XMT) measurements, X-ray diffraction tomography (XDT) and localized X-ray scattering (LXS) are done with set-up 1. In LXS, the region-of-interest is selected from a tomographic reconstruction slice based on the XMT measurement using a small X-ray beam (diameter: 200 µm). Additional wide-angle X-ray scattering (WAXS) measurements are conducted with set-up 2 using a larger X-ray beam (diameter approx. 1 mm). The two-dimensional scattering patterns (Pilatus 1M hybrid pixel array detector) and tomographic reconstruction slices obtained with set-up 2 are stored as TIFF-images (.tif). The two-dimensional scattering patterns (MAR345 image plate detector) obtained with set-up 2 are stored as 32-bit RAW files (unsigned integers, 2300 columns, 2300 rows). The novel combined WAXS/XMT set up (set-up 1) is first presented in: Suuronen, J.-P., Kallonen, A., Hänninen, V., Blomberg, M., Hämäläinen, K., &amp; Serimaa, R. (2014). Bench-top X-ray microtomography complemented with spatially localized X-ray scattering experiments. <em>Journal of Applied Crystallography</em>, <strong>47</strong>(1), 471–475. doi:10.1107/S1600576713031105 Any queries related to the data set or the related Plant Methods article may be directed to the first author by email: Patrik Ahvenainen, PhD; patrik.ahvenainen@alumni.helsinki.fi

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2017-01-09
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