Speckle-Based Dark Field at the Nanoscale

X-ray nanoscopy is an imaging approach that is expected to provide numerous answers regarding the structure of matter at the molecular level. Full-field X-ray imaging can reach such resolution if the setup is combined with strongly focusing optics capable of generating the desired magnification. In this kind of imaging approach, the phase contrast modality is preferred due to the fact that, at this scale, samples present very low absorption and therefore low contrast. To the best of our knowledge Dark Field (DF) has never been measured at spatial resolution better than a micron. The ambition of this proposal is to perform speckle-based imaging to extend the DF range to the nanoscale.