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We proposed a novel method for direct characterization of transient noise and gain for a pulsed low-noise amplifier (LNA) with nanosecond resolution over a wide bandwidth. The method employed a standard noise source and an oscilloscope to measure the time-domain output waveform of the LNA. Transient noise and gain of a gate-pulse-operated C-band LNA at two biases were measured with 50~ns resolution. The method showed good agreement with static measurements. The transient gain was compared with transient S-parameter and drain current measurements, which confirmed the proposed method.
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IEEE DataPort创建时间：
2024-02-06
