Supplmental Material
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资源简介：
The Supplemental Material includes the size testing of 2QL-Al2O3 interfaces, the IDS-VDS output curves of QLs-Al2O3 filed effect transistor devices, and electronic properties of 2QLs-Al2O3 interfaces with MgAl-OH and VAl3- defects.
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AIP Publishing创建时间：
2025-01-11
