Tailoring electrochemical properties of polymers via multi-energy ion implantation

This dataset contains experimental results on the multi-energy ion implantation of polymer films (PI, PMMA, and COC) with Cu⁺ and Ag⁺ ions at fluences of 1×10^12–1×10^14 cm⁻². The dataset is organized into separate folders according to the analytical or simulation method: SRIM (simulated stopping powers and ranges), XPS (X-ray photoelectron spectroscopy), EIS (electrochemical impedance spectroscopy), FTIR (Fourier-transform infrared spectroscopy), and RBS/ERDA (Rutherford backscattering spectrometry and elastic recoil detection analysis). Within each method folder, the data are further structured into subfolders by polymer type, and file names encode the polymer, implanted ion, ion fluence, and spectrum type. FTIR and XPS contain raw text spectra, EIS provides .xlsx files with full frequency response data for Nyquist and Bode plots, RBS/ERDA include raw spectra for elemental analysis, and SRIM contains simulation outputs of energy loss and projected ranges. All measurements and simulations were carried out under well-defined and reproducible conditions. The dataset enables direct comparison between pristine and ion-implanted samples and provides complementary insights into structural, chemical, and electrochemical modifications of polymers induced by multi-energy ion implantation.