Interpretation of the thickness of Quaternary deposits on the inner-continental shelf within the New York Bight, derived from seismic data collected by the U.S. Geological Survey, 1995 - 1999 (Grid, UTM Zone 18N, WGS84 and Esri polyline shapefile, Geographic, WGS84)

Mapping the thickness of the Quaternary sediment is useful for delineating the geologic framework of the New York Bight inner-continental shelf. This in turn aids in understanding the stratigraphic evolution of the inner-continental shelf, the regional sediment transport system, and the influence of the inner-shelf framework on coastal processes. The grid showing the thickness of Quaternary sediment is an important factor in the framework of the coastal region.第四纪沉积物（Quaternary sediment）厚度测绘，对厘定纽约湾海域（New York Bight）内陆架的地质框架具有重要意义。该成果可进一步助力理解内陆架的地层演化、区域沉积物输运系统，以及内陆架框架对海岸过程的影响。第四纪沉积物厚度格网数据，是海岸区域地质框架的关键构成要素。