Supporting data for “Perovskite photodetectors for high-performance imaging: from material engineering to device integration"

This dataset comprises the primary experimental characterization data generated during the research for the thesis "PEROVSKITE PHOTODETECTORS FOR HIGH-PERFORMANCE IMAGING: FROM MATERIAL ENGINEERING TO DEVICE INTEGRATION." It includes raw and processed data obtained from core materials and device analysis techniques: X-ray Diffraction (XRD) for crystal structure and phase identification; Scanning Electron Microscopy (SEM) for surface and cross-sectional morphology; UV-Visible Spectroscopy (UV-Vis) for optical absorption properties and bandgap determination; and Kelvin Atomic Force Microscopy (KPFM) for surface potential, and so on. This comprehensive dataset directly underpins the findings related to perovskite film quality optimization, structure-property relationships, and the photoelectronic performance metrics of the fabricated imaging photodetectors documented in the thesis.