CCD Scan 8044: NiFe_8044
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下载链接:
https://zenodo.org/record/3923174
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资源简介:
Calibration data set measured at Beamline 4.0.2 of the Advanced Light Source (Berkeley, CA) using the resonant soft x-ray scattering endstation.
Scan ID: 8044
Calibration standard with 200-nm X 200-nm pitch
创建时间:
2020-06-30



