微弱电流信号测试及标定数据集

1.1 数据概述 在获取可用于微弱信号精密检测样机试验验证的检测信号中，通过改变外界光源的强度和频率，可以调控InGaAs探测器芯片的输出电流，利用半导体特性测试系统可以获得探测器芯片的输出电流信号随时间的变化(I-t)数据，最终得到课题所需要的微弱电流信号。 1.2内容描述 数据为利用半导体特性测试系统得到的InGaAs探测器I-t特性曲线，格式为.xls，包括test1，test2和test3。 1.3 目录结构描述 本数据集包含三个文件，都为Excel数据，是在不同光源条件下的InGaAs探测器I-t特性曲线 1.4 文件描述 三个数据文件都是Excel格式，每个文件的Data工作表都包含两列数据，第一列数据Time表示测试时间，第二列数据AI表示测试器件InGaAs探测器的输出电流值。1.1 Data Overview To acquire detection signals for prototype test and verification of weak signal precision detection, the output current of the InGaAs detector chip can be regulated by adjusting the intensity and frequency of the external light source. The semiconductor characterization system is used to collect the time-varying output current signals (I-t data) of the detector chip, and finally the weak current signals required for the research project are obtained. 1.2 Content Description The dataset consists of I-t characteristic curves of InGaAs detectors obtained using a semiconductor characterization system, stored in .xls format, including test1, test2 and test3. 1.3 Directory Structure Description This dataset contains three Excel files, which are the I-t characteristic curves of InGaAs detectors tested under different light source conditions. 1.4 File Description All three data files are in Excel format. The Data worksheet of each file contains two columns of data: the first column, labeled Time, represents the test time; the second column, labeled AI, represents the output current value of the tested InGaAs detector device.

搜集汇总

背景与挑战

背景概述

该数据集包含通过半导体特性测试系统获取的InGaAs探测器微弱电流信号I-t特性曲线数据，数据来源于改变光源强度和频率的实验。数据集由三个Excel文件组成，每个文件记录测试时间与输出电流值，用于微弱信号精密检测的验证。