Simultaneous microscopic imaging of thickness and refractive index of thin layers by heterodyne interferometric reflectometry (HiRef) - data
收藏Mendeley Data2024-03-27 更新2024-06-28 收录
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https://research.cardiff.ac.uk/converis/portal/detail/Dataset/136335474?auxfun=&lang=en_GB
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资源简介：
This dataset contains 1)Simulated HiRef signals as function of film refractive index, thickness, and objective numerical aperture 2)Measured HiRef and qDIC data on PVA films and lipid bilayers 3)Analysed thickness and refractive index of the layers 4)Simulated effect of noise on the retrieved thickness and refractive index
创建时间：
2023-06-28
