Analysis code and raw data for 'Automatic Etch Pit Density Analysis in Multicrystalline Silicon'
收藏DataCite Commons2025-04-01 更新2025-04-16 收录
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https://data.mendeley.com/datasets/dv43z9x72t
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资源简介：
"etch_pit_density_analysis.zip" contains the analysis code. See the README.txt for more information. "secco_etched_mc_Si_wafer_image.png" - Optical microscope image, depicting a 2.5cm*1.2cm Secco etched multicrystalline Silicon wafer. Dark spots are etch pits, typically associated with dislocation lines that intersect with the wafer surface. Dark lines are grain boundaries. The leftmost 20% of the wafer have been in contact with the sample carrier during defect etching, explaining the uneven etch result.
提供机构：
Mendeley
创建时间：
2020-07-12
