Dataset - A Comprehensive Evaluation of Contact Recombination and Contact Resistivity Losses in Industrial Silicon Solar Cells

This dataset contains the contact resistivity and contact recombination data associated with the following publication.The contact resistivity data was collected on cTLM, wide pad TLM and narrow pad TLM. The contact recombination data was collected on mini-cells with variation on finger width and spacing. The sample firing temperature was ranging 740 C - 840 C. The finger width was varied from 60 um - 400 um. The finger spacing was varied from 0.8mm - 2.5 mm. <br><br>M. Li <em>et al</em>., "A Comprehensive Evaluation of Contact Recombination and Contact Resistivity Losses in Industrial Silicon Solar Cells," in <em>IEEE Journal of Photovoltaics</em>, doi: 10.1109/JPHOTOV.2020.3003792.<br>