Dataset for "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples"
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下载链接：
https://zenodo.org/record/4753180
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资源简介：
Dataset associated with the publication "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples" by Sina Mayr 1,2,*, Simone Finizio 1, Joakim Reuteler 3, Stefan Stutz 1, Carsten Dubs 4, Markus Weigand 5, Aleš Hrabec 1,2,6, Jörg Raabe 1 and Sebastian Wintz 1,7,*.
1 Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
2 Laboratory for Mesoscopic Systems, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland
3 Scientific Center for Optical and Electron Microscopy, ETH Zurich, 8093 Zurich, Switzerland
4 INNOVENT e.V. Technologieentwicklung Jena, 07745 Jena, Germany
5 Helmholtz-Zentrum Berlin, 14109 Berlin, Germany
6 Laboratory for Magnetism and Interface Physics, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland
7 Max Planck Institute for Intelligent Systems, 70569 Stuttgart, Germany
创建时间：
2021-05-13
