[Dataset] Supplementary Information Assessment of thermo-mechanical phenomena in Si-based diodes via operando confocal Raman microscopy

Name: [Dataset] Supplementary Information Assessment of thermo-mechanical phenomena in Si-based diodes via operando confocal Raman microscopy
Creator: Elsevier BV
Published: 2025-08-05 02:15:50
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DataCite Commons2025-08-05 更新2026-04-25 收录

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https://digital.csic.es/handle/10261/396791

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资源简介：

Assessment of thermo-mechanical phenomena in Si-based diodes via operando confocal Raman microscopy

提供机构：

Elsevier BV

创建时间：

2025-08-05